Netherlands – Microelectronic machinery and apparatus and microsystems – Metrology SEM+FIB system
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Classification
AI proposal generator
Generate a structured solution proposal in 90 seconds
Kimi drafts an 8-section bid response — exec summary, technical approach, compliance matrix, indicative pricing, timeline, why-we-win — tailored to your company profile and this exact tender.
Related opportunities
Similar tenders
Czechia – Scanning electron microscopes – UPOL/PřF/KEF - Systém FIB-SEM včetně analytických technik a nanoindentace
Univerzita Palackého v Olomouci
Sweden – Scanning electron microscopes – SEM
Chalmers Tekniska Högskola Aktiebolag
Romania – Mass spectrometer – Echipamente de cercetare pentru dotarea Laboratorului de radioizotopi
INSTITUTUL NATIONAL DE CERCETARE-DEZVOLTARE PENTRU GEOLOGIE SI GEOECOLOGIE MARINA GEOECOMAR
Procurement of various types of Circuit Breaker , Meter and other electric goods.
Zeal Bangla Sugar Mills Ltd.
Germany – Miscellaneous special-purpose machinery – System for High Apect Ratio Etch consisting of mainframe and process chambers (IPMS-CNT05.1) - PR1153448-2480-P
Fraunhofer-Gesellschaft - Einkauf B12
Free tender alerts
Get a weekly digest of European Union tenders
New European Union tenders matching your interests, delivered to your inbox once a week — no app required. Add keywords and we'll filter the digest to match.